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			In x-ray diffraction, powder method refers to analysis of specimens consisting of many crystallites. This can either be true powders (e.g. baby powder) or polycrystalline solids.   Above: Technicians process a sample using x-ray powder diffraction method.   Phase Identification - qualitative, semi-quantitative (Relative Intensity Ratio Method) and quantitative (Rietveld method) Lattice parameter measurement Crystal size and microstrain measurement Residual stress Texture analysis (pole figures and orientation distribution function) Please refer to the examples listed on the right of this page Bruker D8 Discover with GADDS Area Detector State-of-the-art area detector with real-time display Point focus with microdiffraction capability down to 150 microns Videomicroscope/laser alignment system Centric Eulerian one-quarter cradle, 360 degree phi stage, x-y-z stages, all motorized and computer controlled Reflection or transmission geometry Hot stage for data acquisition in high vacuum, air or argon up to 1100C Sample sizes up to 40mm x 80mm x 80mm (25mm diameter and 3mm thick for hot stage) Automated data acquisition Cu>Mn and Cr x-ray sources Phillips APD3600 Automatic Powder Diffractometer Focusing geometry (Bragg-Brentano) Sample sizes up to 140mm x 140 mm x 140mm Automated data acquisition Cu x-ray source   Above: Close-up of D8 Discover w/GADDS x-ray Diffractometer.   For further information please contact Rick Rogers Phase ID - Example 1 + View example Phase ID - Example 2 + View example Texture Example + View example
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