The Electron Microprobe Facility at NASA Glenn is equipped with a scanning electron microprobe which can analyze elements from Be through U with sensitivities ranging from 100% to 50PPM. The microprobe is typically used for detailed microchemical analysis.
Above: Quantitative elemental maps
JEOL 8200 Super Probe
Five two-crystal WDX spectrometers
Analysis Be-U with 100% to 50PPM sensitivity
1-2% relative analytical accuracy
1.0 micron spatial resolution
Typical analysis time 10s for major components and 300s for trace components
Simulataneous EDX-WDX quantitative analysis
Above: Technician operating the JEOL 8200 Electron Probe.